3

Circuit level interconnect reliability study using 3D circuit model

Year:
2010
Language:
english
File:
PDF, 3.08 MB
english, 2010
6

Electromigration reliability of interconnections in RF low noise amplifier circuit

Year:
2012
Language:
english
File:
PDF, 2.39 MB
english, 2012
7

Effect of IC layout on the reliability of CMOS amplifiers

Year:
2012
Language:
english
File:
PDF, 1.70 MB
english, 2012
23

Comparison of electromigration simulation in test structure and actual circuit

Year:
2012
Language:
english
File:
PDF, 1.57 MB
english, 2012